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Journal description
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Details for article 1 of 35 found articles
| Title: |
A junction-level optoelectronic characterization of etching-induced damage for third-generation HgCdTe infrared focal-plane array photodetectors |
| Author: |
Wang, Peng Wang, Yueming Wu, Mingzai Ye, Zhenhua |
| Appeared in: |
Infrared physics and technology |
| Paging: | Volume 91 (2018) nr. C pages 119-122 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 35 found articles
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