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Journal description
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Details for article 45 of 67 found articles
| Title: |
Normal spectral emissivity measurement of thermal management materials for electronic components in the 2–14 μm range |
| Author: |
Wang, Yang Zhao, Yongao Zhang, Xu Zhang, Yufeng Dai, Jingmin |
| Appeared in: |
Infrared physics and technology |
| Paging: | Volume 142 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 45 of 67 found articles
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