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Journal description
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Details for article 16 of 37 found articles
| Title: |
Image calculation of a tilted contamination deposit for the thickness measurement of a TEM foil |
| Author: |
Sawai, T. Suzuki, M. |
| Appeared in: |
Scripta metallurgica et materiala |
| Paging: | Volume 24 (1990) nr. 11 pages 6 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 37 found articles
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