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  A simple and inclusive method to determine the habit plane in transmission electron microscope based on accurate measurement of foil thickness
 
 
Title: A simple and inclusive method to determine the habit plane in transmission electron microscope based on accurate measurement of foil thickness
Author: Qiu, Dong
Zhang, Mingxing
Appeared in: Materials characterization
Paging: Volume 94 (2014) nr. C pages 6 p.
Year: 2014
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 24 found articles
 
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