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Journal description
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Details for article 16 of 16 found articles
| Title: |
X-ray microstructural analysis of nanocrystalline TiZrN thin films by diffraction pattern modeling |
| Author: |
Escobar, D. Ospina, R. Gómez, A.G. Restrepo-Parra, E. Arango, P.J. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 88 (2014) nr. C pages 8 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 16 found articles
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