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Details for article 23 of 31 found articles
| Title: |
Notes on representing grain size distributions obtained by electron backscatter diffraction |
| Author: |
Toth, Laszlo S. Biswas, Somjeet Gu, Chengfan Beausir, Benoit |
| Appeared in: |
Materials characterization |
| Paging: | Volume 84 (2013) nr. C pages 5 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 31 found articles
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