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                                       Details for article 4 of 16 found articles
 
 
  Characterization of multilayer nitride coatings by electron microscopy and modulus mapping
 
 
Title: Characterization of multilayer nitride coatings by electron microscopy and modulus mapping
Author: Pemmasani, Sai Pramod
Rajulapati, Koteswararao V.
Ramakrishna, M.
Valleti, Krishna
Gundakaram, Ravi C.
Joshi, Shrikant V.
Appeared in: Materials characterization
Paging: Volume 81 (2013) nr. C pages 12 p.
Year: 2013
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 16 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands