|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 15 found articles
| Title: |
High-resolution TEM characterization of SiC nanowires as reinforcements in a nanocrystalline Mg-matrix |
| Author: |
Pozuelo, Marta Kao, Wei H. Yang, Jenn-Ming |
| Appeared in: |
Materials characterization |
| Paging: | Volume 77 (2013) nr. C pages 8 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 15 found articles
| << previous | next >> |