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Details for article 1 of 19 found articles
| Title: |
Compositional analysis and depth profiling of thin film CrO2 by heavy ion ERDA and standard RBS: a comparison |
| Author: |
Khamlich, S. Msimanga, M. Pineda-Vargas, C.A. Nuru, Z.Y. McCrindle, R. Maaza, M. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 70 (2012) nr. C pages 6 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 19 found articles
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