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  Compositional analysis and depth profiling of thin film CrO2 by heavy ion ERDA and standard RBS: a comparison
 
 
Title: Compositional analysis and depth profiling of thin film CrO2 by heavy ion ERDA and standard RBS: a comparison
Author: Khamlich, S.
Msimanga, M.
Pineda-Vargas, C.A.
Nuru, Z.Y.
McCrindle, R.
Maaza, M.
Appeared in: Materials characterization
Paging: Volume 70 (2012) nr. C pages 6 p.
Year: 2012
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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