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Details for article 11 of 15 found articles
| Title: |
Stereology of backscatter electron images of etched surfaces for characterization of particle size distributions and volume fractions: Estimation of imaging bias via Monte Carlo simulations |
| Author: |
Payton, E.J. Mills, M.J. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 62 (2011) nr. 6 pages 12 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 15 found articles
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