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Journal description
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Details for article 10 of 10 found articles
| Title: |
X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloy |
| Author: |
Kapoor, K. Lahiri, D. Batra, I.S. Rao, S.V.R. Sanyal, T. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 54 (2005) nr. 2 pages 10 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 10 found articles
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