Digital Library
Close Browse articles from a journal
 
   next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 1 of 14 found articles
 
 
  Backscattered electron microscopy technique enhancing stretch zone width imaging for initiation fracture toughness measurements
 
 
Title: Backscattered electron microscopy technique enhancing stretch zone width imaging for initiation fracture toughness measurements
Author: Tarpani, J.R.
Bose, W.W.
Spinelli, D.
Appeared in: Materials characterization
Paging: Volume 51 (2003) nr. 2-3 pages 12 p.
Year: 2003
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 1 of 14 found articles
 
   next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands