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Journal description
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Details for article 2 of 27 found articles
| Title: |
Application of confocal laser scanning microscopy, atomic force microscopy, and the profilometric method in quantitative fractography |
| Author: |
Cwajna, Jan Roskosz, Stanisław |
| Appeared in: |
Materials characterization |
| Paging: | Volume 46 (2001) nr. 2-3 pages 5 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 27 found articles
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