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Journal description
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Details for article 2 of 7 found articles
| Title: |
Determination of Habit Planes Using Trace Widths in TEM |
| Author: |
Zhang, M.-X Kelly, P.M Gates, J.D |
| Appeared in: |
Materials characterization |
| Paging: | Volume 43 (1999) nr. 1 pages 10 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 7 found articles
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