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Journal description
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Details for article 5 of 10 found articles
| Title: |
Scanning tunneling microscopy imaging of grain boundaries and triple junctions in copper |
| Author: |
Bruce, G.D. Fortier, P. Palumbo, G. Guillet, J.E. Vancso, G.J. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 28 (1992) nr. 2 pages 5 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 10 found articles
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