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Details for article 56 of 75 found articles
| Title: |
Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy |
| Author: |
Hou, Yaoping Wang, Guorui Ma, Chengfu Feng, Zhihua Chen, Yuhang Filleter, Tobin |
| Appeared in: |
Materials characterization |
| Paging: | Volume 193 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 56 of 75 found articles
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