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An atomic scale characterization of a novel basal plate with a close-packed structure in Mg-Nd-In alloys |
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Titel: |
An atomic scale characterization of a novel basal plate with a close-packed structure in Mg-Nd-In alloys |
Auteur: |
Tian, Yan Lou, Weixin Ren, Jingxin Wang, Jing Huang, Qiyuan Xie, Guangming Xie, Hongbo Tan, Jun Xiao, Na Sun, Benzhe |
Verschenen in: |
Materials characterization |
Paginering: |
Jaargang 178 () nr. C pagina's p. |
Jaar: |
2021 |
Inhoud: |
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Uitgever: |
Elsevier Inc. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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