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Details for article 100 of 100 found articles
| Title: |
Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid |
| Author: |
Famelton, J.R. Hughes, G.M. Williams, C.A. Barbatti, C. Moody, M.P. Bagot, P.A.J. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 178 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 100 of 100 found articles
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