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Details for article 3 of 41 found articles
| Title: |
An algorithm for resolving intragranular orientation fields using coupled far-field and near-field high energy X-ray diffraction microscopy |
| Author: |
Nygren, Kelly E. Pagan, Darren C. Bernier, Joel V. Miller, Matthew P. |
| Appeared in: |
Materials characterization |
| Paging: | Volume 165 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 41 found articles
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