|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 29 found articles
| Title: |
Atomic-scale characterization of interfaces between 2A70 aluminum alloy matrix and Cu-enriched layer after electropolishing |
| Author: |
Wang, Zhige Lv, Kexin Zheng, Jingxu Kent Chen, Bin |
| Appeared in: |
Materials characterization |
| Paging: | Volume 150 (2019) nr. C pages 150-154 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 29 found articles
| << previous | next >> |