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Details for article 69 of 71 found articles
| Title: |
Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography |
| Author: |
Singh, Sudhanshu S. Loza, Jose J. Merkle, Arno P. Chawla, Nikhilesh |
| Appeared in: |
Materials characterization |
| Paging: | Volume 118 (2016) nr. C pages 102-111 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 69 of 71 found articles
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