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Journal description
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Details for article 23 of 37 found articles
| Title: |
Measurement of film thickness up to several hundreds of nanometers using optical waveguide lightmode spectroscopy |
| Author: |
Picart, Catherine Gergely, Csilla Arntz, Youri Voegel, Jean-Claude Schaaf, Pierre Cuisinier, Frédéric J.G. Senger, Bernard |
| Appeared in: |
Biosensors and bioelectronics |
| Paging: | Volume 20 (2004) nr. 3 pages 9 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 37 found articles
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