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Journal description
All volumes of the corresponding journal
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Details for article 71 of 145 found articles
| Title: |
Integrity evaluation of SiO x film on polyethylene terapthalate by AE characterization and laser microscopy |
| Author: |
Futatsugi, Takashi Ogawa, Shingo Takemoto, Mikio Yanaka, Masa-aki Tsukahara, Yusuke |
| Appeared in: |
NDT and E international |
| Paging: | Volume 29 (1996) nr. 5 pages 10 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 71 of 145 found articles
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