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                                       Details for article 94 of 109 found articles
 
 
  Statistical, simulation and modeling analysis of variability in memristors with single and bilayer dielectrics of HfO2 and Al2O3, a comparison
 
 
Title: Statistical, simulation and modeling analysis of variability in memristors with single and bilayer dielectrics of HfO2 and Al2O3, a comparison
Author: Cantudo, A.
Jiménez-Molinos, F.
Ruiz, P.Q.
López, A.
Villena, M.A.
González, M.B.
Campabadal, F.
Roldán, J.B.
Appeared in: Chaos, solitons & fractals
Paging: Volume 196 () nr. C pages p.
Year: 2025
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 94 of 109 found articles
 
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