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Statistical, simulation and modeling analysis of variability in memristors with single and bilayer dielectrics of HfO2 and Al2O3, a comparison |
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Title: |
Statistical, simulation and modeling analysis of variability in memristors with single and bilayer dielectrics of HfO2 and Al2O3, a comparison |
Author: |
Cantudo, A. Jiménez-Molinos, F. Ruiz, P.Q. López, A. Villena, M.A. González, M.B. Campabadal, F. Roldán, J.B. |
Appeared in: |
Chaos, solitons & fractals |
Paging: |
Volume 196 () nr. C pages p. |
Year: |
2025 |
Contents: |
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Publisher: |
The Authors |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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