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Journal description
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Details for article 9 of 11 found articles
| Title: |
Spectroscopic ellipsometry technique as a materials characterization tool for mechatronic systems—The case of composition and doping concentration monitoring in SBN crystals |
| Author: |
Dorywalski, Krzysztof Maciejewski, Igor Krzyżyński, Tomasz |
| Appeared in: |
Mechatronics |
| Paging: | Volume 37 (2016) nr. C pages 9 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 11 found articles
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