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  Application of wavelet transforms and neural networks to the recognition and classification of blemishes
 
 
Title: Application of wavelet transforms and neural networks to the recognition and classification of blemishes
Author: Chen, Haibo
Hewit, Jim
Appeared in: Mechatronics
Paging: Volume 10 (2000) nr. 6 pages 13 p.
Year: 2000
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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