|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 13 of 14 found articles
| Title: |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
| Author: |
Martinez, G.T. De Backer, A. Rosenauer, A. Verbeeck, J. Van Aert, S. |
| Appeared in: |
Micron |
| Paging: | Volume 63 (2014) nr. C pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 14 found articles
| << previous | next >> |