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Journal description
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Details for article 20 of 33 found articles
| Title: |
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics |
| Author: |
Artyukov, I.A. Feschenko, R.M. Vinogradov, A.V. Bugayev, Ye.A. Devizenko, O.Y. Kondratenko, V.V. Kasyanov, Yu.S. Hatano, T. Yamamoto, M. Saveliev, S.V. |
| Appeared in: |
Micron |
| Paging: | Volume 41 (2010) nr. 7 pages 7 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 33 found articles
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