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Journal description
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Details for article 17 of 34 found articles
| Title: |
In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon |
| Author: |
Bhaskaran, M. Sriram, S. Perova, T.S. Ermakov, V. Thorogood, G.J. Short, K.T. Holland, A.S. |
| Appeared in: |
Micron |
| Paging: | Volume 40 (2009) nr. 1 pages 5 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 34 found articles
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