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Journal description
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Details for article 12 of 12 found articles
| Title: |
Transmission electron microscopy investigation of the formation of C54–TiSi2 phase on stressed (001)Si |
| Author: |
Cheng, S.L. Chang, S.M. Huang, H.Y. Chen, L.J. Tsai, C.J. |
| Appeared in: |
Micron |
| Paging: | Volume 33 (2002) nr. 6 pages 5 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 12 found articles
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