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Details for article 2 of 18 found articles
| Title: |
Comparative electron diffraction analysis of strain relaxation in AlxGa1-xN materials in the microelectronics industry: 4D-STEM approach vs. TEM-based N-PED solution |
| Author: |
Drouillas, Estève Mattei, Jean-Gabriel Warot-Fonrose, Bénédicte |
| Appeared in: |
Micron |
| Paging: | Volume 190 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
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