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Journal description
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Details for article 10 of 14 found articles
| Title: |
Multiple-ellipse fitting method to precisely measure the positions of atomic columns in a transmission electron microscope image |
| Author: |
Zhang, Q. Jin, C.H. Xu, H.T. Zhang, L.Y. Ren, X.B. Ouyang, Y. Wang, X.J. Yue, X.J. Lin, F. |
| Appeared in: |
Micron |
| Paging: | Volume 113 (2018) nr. C pages 99-104 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 14 found articles
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