Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
Titel:
Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
Auteur:
Wierzchowski, W. Wieteska, K. Klinger, D. Sobierajski, R. Pelka, J.B. Żymierska, D. Balcer, T. Chalupský, J. Gaudin, J. Hájková, V. Burian, T. Gleeson, A.J. Juha, L. Sinn, H. Sobota, D. Tiedtke, K. Toleikis, S. Tschentscher, T. Vyšín, L. Wabnitz, H. Paulmann, C.