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Journal description
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Details for article 13 of 39 found articles
| Title: |
Film thickness effect on the properties of interconnection between YBCO and Si for superconductor and semiconductor integration |
| Author: |
Jeong, Y.S Park, J.H Eun, D.S Lee, S.Y Kim, C.H Hahn, T.S Kim, J.Y Yang, I.-S |
| Appeared in: |
Applied superconductivity |
| Paging: | Volume 5 (1997) nr. 7-12 pages 4 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 39 found articles
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