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                                       Details for article 7 of 70 found articles
 
 
  Analysis of stress intensity factors and T-stress to control crack propagation for kerf-less spalling of single crystal silicon foils
 
 
Title: Analysis of stress intensity factors and T-stress to control crack propagation for kerf-less spalling of single crystal silicon foils
Author: Bouchard, P.-O.
Bernacki, M.
Parks, D.M.
Appeared in: Computational materials science
Paging: Volume 69 (2013) nr. C pages 8 p.
Year: 2013
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 70 found articles
 
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