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Journal description
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Details for article 7 of 84 found articles
| Title: |
Atomistic comparative study of VUV photodeposited silicon nitride on InP(100) by simulation and atomic force microscopy: discrete representation and topological analysis |
| Author: |
Flicstein, J Guillonneau, E Marquez, J How Kee Chun, L.S Maisonneuve, D David, C Wang, Zh.Zh Palmier, J.F Courant, J.L |
| Appeared in: |
Computational materials science |
| Paging: | Volume 17 (2000) nr. 2-4 pages 9 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 84 found articles
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