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Journal description
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Details for article 18 of 24 found articles
| Title: |
Statistical and image analysis for characterizing simulated atomic-scale damage in crystals |
| Author: |
Li, D. Reich, B.J. Brenner, D.W. |
| Appeared in: |
Computational materials science |
| Paging: | Volume 135 (2017) nr. C pages 8 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 24 found articles
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