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Journal description
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Details for article 14 of 37 found articles
| Title: |
Influence of extended defects and oval shaped facet on the minority carrier lifetime distribution in as-grown 4H-SiC epilayers |
| Author: |
Cui, Yingxin Li, Juntao Zhou, Kun Zhang, Xinhe Sun, Guosheng |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 92 (2019) nr. C pages 25-31 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 37 found articles
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