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                                       Details for article 22 of 210 found articles
 
 
  Characterization of DLC:Si films by the gas effusion technique
 
 
Title: Characterization of DLC:Si films by the gas effusion technique
Author: Camargo Jr., S.S.
Santos, R.A.
Beyer, W.
Appeared in: Diamond and related materials
Paging: Volume 9 (2000) nr. 3-6 pages 5 p.
Year: 2000
Contents:
Publisher: Elsevier Science S.A.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 210 found articles
 
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