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Journal description
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Details for article 26 of 33 found articles
| Title: |
Structural analysis of a-C:H and a-C:H:Si films under high-pressure and high-temperature by synchrotron X-ray diffraction |
| Author: |
Hirayama, Tomoko Eguchi, Yuri Saeki, Koichi Matsuoka, Takashi Kikegawa, Takumi |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 70 (2016) nr. C pages 8 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 33 found articles
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