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Journal description
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Details for article 80 of 98 found articles
| Title: |
Spectroscopic ellipsometry measurements of the diamond-crystalline Si interface in chemically vapour-deposited polycrystalline diamond films |
| Author: |
Cifre, J. Campmany, J. Bertran, E. Esteve, J. |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 2 (1993) nr. 5-7 pages 4 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 80 of 98 found articles
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