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Journal description
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Details for article 82 of 114 found articles
| Title: |
Micro-Raman, SEM, XPS, and electron field emission characterizations of nitrogen-induced shallow defects on nanodiamond films fabricated with different growth parameters |
| Author: |
LeQuan, X.C. Kang, W.P. Davidson, J.L. Guo, M. Choi, B.K. |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 18 (2009) nr. 2-3 pages 5 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 82 of 114 found articles
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