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                                       Details for article 105 of 111 found articles
 
 
  Thick diamond layers angled by polishing to reveal defect and impurity depth profiles
 
 
Title: Thick diamond layers angled by polishing to reveal defect and impurity depth profiles
Author: Tallaire, A.
Kasu, M.
Ueda, K.
Appeared in: Diamond and related materials
Paging: Volume 17 (2008) nr. 4-5 pages 5 p.
Year: 2008
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 105 of 111 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands