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                                       Details for article 7 of 52 found articles
 
 
  Characterization of silicon films grown by atomic layer deposition on nanocrystalline diamond
 
 
Title: Characterization of silicon films grown by atomic layer deposition on nanocrystalline diamond
Author: Zang, J.B.
Lu, J.
Qi, X.H.
Wang, Y.H.
Appeared in: Diamond and related materials
Paging: Volume 15 (2006) nr. 9 pages 4 p.
Year: 2006
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 52 found articles
 
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