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                                       Details for article 72 of 154 found articles
 
 
  Incorporation of Si in a-C:Si:H films monitored by infrared excited Raman scattering
 
 
Title: Incorporation of Si in a-C:Si:H films monitored by infrared excited Raman scattering
Author: Veres, M.
Koós, M.
Orsós, N.
Tóth, S.
Füle, M.
Mohai, M.
Bertóti, I.
Appeared in: Diamond and related materials
Paging: Volume 15 (2006) nr. 4-8 pages 4 p.
Year: 2006
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 72 of 154 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands