|
| << previous |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 34 of 34 found articles
| Title: |
XPS studies on damage evaluation of single-crystal diamond chips processed with ion beam etching and reactive ion beam assisted chemical etching |
| Author: |
Kawabata, Yusaku Taniguchi, Jun Miyamoto, Iwao |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 13 (2004) nr. 1 pages 6 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 34 found articles
| << previous |