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Journal description
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Details for article 177 of 202 found articles
| Title: |
Surface analysis and defect characterization of 4H–SiC wafers for power electronic device applications |
| Author: |
Scaltrito, L. Fanchini, G. Porro, S. Cocuzza, M. Giorgis, F. Pirri, C.F. Mandracci, P. Ricciardi, C. Ferrero, S. Sgorlon, C. Richieri, G. Merlin, L. |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 12 (2003) nr. 3-7 pages 3 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 177 of 202 found articles
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