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Journal description
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Details for article 40 of 92 found articles
| Title: |
Helium effusion measurements for studying the microstructure of a-SiC:H films deposited by d.c. sputtering |
| Author: |
Saleh, R Munisa, L Beyer, W |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 12 (2003) nr. 10-11 pages 5 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 40 of 92 found articles
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