Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 40 of 55 found articles
 
 
  Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon
 
 
Title: Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon
Author: Tsu, David V.
Schuelke, Thomas
Slagter, John
Appeared in: Diamond and related materials
Paging: Volume 110 () nr. C pages p.
Year: 2020
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 40 of 55 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands