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Journal description
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Details for article 40 of 55 found articles
| Title: |
Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon |
| Author: |
Tsu, David V. Schuelke, Thomas Slagter, John |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 110 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 40 of 55 found articles
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