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Journal description
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Details for article 2 of 69 found articles
| Title: |
Analysis of contamination in diamond films by secondary ion mass spectroscopy |
| Author: |
Cifre, J. Lopez, F. Morenza, J.L. Esteve, J. |
| Appeared in: |
Diamond and related materials |
| Paging: | Volume 1 (1992) nr. 5-6 pages 4 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 69 found articles
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